-
1 on-wafer chip testing
1) Электроника: испытания кристаллов на неразделённой пластине2) Микроэлектроника: проверка кристаллов на полупроводниковой пластине -
2 on-wafer chip testing
микр. испытания кристаллов на пластинеEnglish-Russian electronics dictionary > on-wafer chip testing
-
3 on-wafer chip testing
проверка кристаллов на п/п пластинеEnglish-Russian dictionary of microelectronics > on-wafer chip testing
-
4 on-wafer chip testing
English-Russian dictionary of electronics > on-wafer chip testing
-
5 testing
1) испытания2) проверка; контроль3) тестирование•- battery testing
- beta testing - dye-penetrant testing
- electromagnetic compatibility testing
- EMC testing
- functional testing
- gamma testing
- gated-noise testing
- high-stress testing
- hypothesis testing
- immersion testing
- in-circuit testing
- in-isolation testing
- microphone testing with orchestral instruments
- mutation testing
- on-wafer chip testing
- path testing
- program testing
- pulse-echo testing
- random-noise testing
- regressive testing
- saturation testing
- sequential testing
- software testing
- static structure testing
- strain-gage testing
- stress testing
- stub testing
- syndrome testing
- usability testing
- vacuum testing
- X-ray testing -
6 circuit
2) канал3) т. граф. простая цепь, контур•- active circuit
- acyclic circuit
- adding circuit
- add circuit
- addressing circuit
- advancing circuit
- alarm circuit
- amplifying circuit
- analogous circuit
- analog circuit
- AND-to-OR circuit
- antialiasing circuit
- anticoincidence circuit
- antihunting circuit
- antihunt circuit
- aperiodic circuit
- arithmetic circuit
- arithmetical circuit
- astable circuit
- averaging circuit
- balanced circuit
- basis circuit
- beam-lead integrated circuit
- benchmark circuit
- binary-valued digital circuit
- binary-valued circuit
- bipolar circuit
- bistable circuit
- blanking circuit
- bleeder circuit
- bridge circuit
- buffer circuit
- carry circuit
- character selection circuit
- checking circuit
- check circuit
- clamping circuit
- clocked circuit
- clock-recovery circuit
- closed circuit
- code disjoint circuit
- coincidence circuit
- combinational circuit
- combinatorial circuit
- communication circuit
- comparator circuit
- compare circuit
- comparison circuit
- complementary circuit
- complementary integrated circuit
- complementary transistor logic circuit
- complex function circuit
- computer circuit
- computer test circuit
- computing circuit
- control circuit
- core-diode circuit
- core-transistor circuit
- correcting circuit
- correction circuit
- counter circuit
- counting circuit
- coupling circuit
- current-limit circuit
- current-operated circuit
- current-summation circuit
- custom product integrated circuit
- custom integrated circuit
- custom-wired integrated circuit
- cutoff circuit
- cycle circuit
- cyclic circuit
- dead-on-arrival integrated circuit
- decode circuit
- decoding circuit
- deenergizing circuit
- deflection circuit
- delay circuit
- densely packed circuit
- differentiating circuit
- digital computing circuit
- diode circuit
- diode-coupled circuit
- diode-transistor logic circuit
- direct-coupled circuit
- direct-coupled transistor logic circuit
- direct-current circuit
- discrete component circuit
- discrete logic-level
- discrete wired circuit
- display circuit
- divide-by-two circuit
- dividing circuit
- double-sided printed circuit
- doubling circuit
- drive circuit
- dry circuit
- dual circuit
- duplex circuit
- Eccles-Jordan circuit
- edge-activated circuit
- emitter-coupled circuit
- emitter-coupled logic circuit
- emitter-emitter-coupled logic circuit
- equality circuit
- equivalent circuit
- etched circuit
- Euler circuit
- except circuit
- fanout-free circuit
- fast-switching circuit
- fault detection circuit
- fault-free circuit
- fault-secure circuit
- faulty circuit
- feedback circuit
- ferrite-diode circuit
- ferrite-transistor circuit
- ferroresonant computing circuit
- film integrated circuit
- flag-testing circuit
- flat-pack integrated circuit
- flexible printed circuit
- flexible circuit
- flip-chip integrated circuit
- flip-flop circuit
- frame-grounding circuit
- frequency-halving circuit
- function circuit
- gate circuit
- Goto-pair circuit
- half-duplex circuit
- halving circuit
- Hamilton circuit
- hand-designed circuit
- hardwired circuit
- high-speed circuit
- high-threshold logic circuit
- holding circuit
- hybrid circuit
- idler circuit
- imbedded circuit
- IMOS circuit
- impulse circuit
- inhibit circuit
- input circuit
- integrated circuit
- integrating circuit
- integro-differential circuit
- interchange circuit
- interface circuit
- interfacing circuit
- interlock circuit
- invert circuit
- ion-implanted MOS circuit
- irredundant circuit
- Josephson integrated circuit
- junction transistor circuit
- ladder circuit
- lag-lead circuit
- laminar circuit
- large arithmetic circuit
- large-scale integrated circuit
- large-scale integration circuit
- latch circuit
- lead-lag circuit
- leased circuit
- level circuit
- linear circuit
- linear integrated circuit
- linearity circuit
- liquid logic circuit
- load circuit
- locked pair circuit
- locking circuit
- logic circuit
- logical circuit
- low-threshold integrated circuit
- LSI circuit
- lumped circuit
- magnetic circuit
- magnetic-core circuit
- majority circuit
- match circuit
- material equivalence circuit
- matrix circuit
- maximum-remembering circuit
- measuring circuit
- medium-scale integration circuit
- memory circuit
- memory-decoder circuit
- message circuit
- metal-oxide-semiconductor circuit
- microamp circuit
- microelectronic integrated circuit
- microminiature circuit
- microwave circuit
- mil spec integrated circuit
- milliwatt circuit
- miniature circuit
- minimum-remembering circuit
- mixed-level circuit
- mixing circuit
- modularized circuit
- molecular integrated circuit
- monitoring circuit
- monolithic integrated circuit
- monostable circuit
- MOS circuit
- MOS integrated circuit
- MOS LSI circuit
- MSI circuit
- multichip integrated circuit
- multifunction integrated circuit
- multilayer circuit
- multilevel circuit
- multiple output circuit
- multiplying circuit
- multipoint circuit
- multistable circuit
- multistage circuit
- nanosecond circuit
- n-channel circuit
- network circuit
- noise-balancing circuit
- noncoincidence circuit
- noncutoff circuit
- non-self-checking circuit
- one-core-per-bit circuit
- one-generator equivalent circuit
- one-out-of-four selecting circuit
- one-shot circuit
- open circuit
- optical commutation circuit
- optical memory circuit
- optically coupled circuit
- optoelectronic circuit
- output circuit
- packaged circuit
- packed circuit
- p-channel circuit
- phantom circuit
- phase-comparison circuit
- phase-inverting circuit
- picosecond circuit
- pilot circuit
- plastic-embedded circuit
- point-to-point circuit
- power circuit
- power monitoring circuit
- power-fail circuit
- printed circuit
- priority circuit
- propagation circuit
- protection circuit
- pulse circuit
- pulse-actuated circuit
- pulse-broadening circuit
- pulse-regenerating circuit
- pulse-shaping circuit
- pulse-stretching circuit
- pulse-switching circuit
- pumped tunnel-diode transistor logic circuit
- pumping circuit
- quenching circuit
- race-free circuit
- radio-frequency circuit
- random-logic circuit
- ratioed circuit
- reading circuit
- received-data circuit
- receiving circuit
- reconfigurable integrated circuit
- redundant circuit
- reference circuit
- refreshing circuit
- relaxation circuit
- reset circuit
- retriggerable circuit
- rewriting circuit
- ring circuit
- rounding circuit
- sample-hold circuit
- saturated circuit
- scale-of-N circuit
- scale-of-two circuit
- scaling circuit
- schematic circuit
- Schmitt trigger circuit
- Schmitt circuit
- screen printed circuit
- selection circuit
- select circuit
- self-checking circuit
- self-testing circuit
- self-timed circuit
- semiconductor circuit
- send-request circuit
- sequential circuit
- shifting circuit
- shift circuit
- short circuit
- shunt-peaking circuit
- sign-controlled circuit
- silicon integrated circuit
- silicon-on-sapphire integrated circuit
- simplex circuit
- single-chip circuit
- single-ended circuit
- single-level circuit
- single-phase circuit
- single-shot circuit
- small-scale integration circuit
- solid-state circuit
- solid circuit
- SOS integrated circuit
- squaring circuit
- SSI circuit
- stabilizing circuit
- stamped circuit
- start-stop circuit
- steering circuit
- storage circuit
- storage-selection circuit
- strongly fault-secure circuit
- subtraction circuit
- summing circuit
- sweep circuit
- switching circuit
- symbolic circuit
- synchronizing circuit
- synthesis circuit
- thick-film circuit
- thin-film circuit
- threshold circuit
- time-anticoincidence circuit
- time-base circuit
- time-coincidence circuit
- time-delay circuit
- toll circuit
- totally self-checking circuit
- transistor circuit
- transistor-core circuit
- transistor-resistor circuit
- transistor-transistor-logic circuit
- translation circuit
- transmitted-data circuit
- transmitting circuit
- tree circuit
- trigger -action circuit
- trigger circuit
- trunk circuit
- tunnel diode circuit
- twin-tunnel-diode circuit
- twin circuit
- two-cores-per-bit circuit
- two-input circuit
- two-level circuit
- two-way circuit
- ultra-large-scale integration circuit
- unidirectional circuit
- unpackaged circuit
- unpacked circuit
- very-high-speed integrated circuit
- very-large-scale integration circuit
- virtual circuit
- VLSI circuit
- voice circuit
- voice-grade circuit
- voltage-control circuit
- voltage-doubling circuit
- voltage-multiplying circuit
- voltage-summation circuit
- voter circuit
- wave-shaping circuit
- whole-wafer circuit
- wired AND circuit
- wired OR circuit
- wire-wrapped circuit
- writing circuit
- zero circuitEnglish-Russian dictionary of computer science and programming > circuit
См. также в других словарях:
on-wafer chip testing — plokštelės lustų tikrinimas statusas T sritis radioelektronika atitikmenys: angl. on wafer chip testing vok. Chiptesten auf dem Wafer, n; On Wafer Chiptesten, n rus. проверка кристаллов ИС на пластине, f pranc. test des puces in situ, m … Radioelektronikos terminų žodynas
Wafer-scale integration — Wafer scale integration, WSI for short, is a yet unused system of building very large integrated circuit networks that use an entire silicon wafer to produce a single super chip . Through a combination of large size and reduced packaging, WSI… … Wikipedia
Wafer testing — is a step performed during semiconductor device fabrication. During this step, performed before a wafer is sent to die preparation, all individual integrated circuits that are present on the wafer are tested for functional defects by applying… … Wikipedia
Chiptesten auf dem Wafer — plokštelės lustų tikrinimas statusas T sritis radioelektronika atitikmenys: angl. on wafer chip testing vok. Chiptesten auf dem Wafer, n; On Wafer Chiptesten, n rus. проверка кристаллов ИС на пластине, f pranc. test des puces in situ, m … Radioelektronikos terminų žodynas
On-Wafer-Chiptesten — plokštelės lustų tikrinimas statusas T sritis radioelektronika atitikmenys: angl. on wafer chip testing vok. Chiptesten auf dem Wafer, n; On Wafer Chiptesten, n rus. проверка кристаллов ИС на пластине, f pranc. test des puces in situ, m … Radioelektronikos terminų žodynas
Wafer prober — A wafer prober is a machine used to test integrated circuits. OverviewIntegrated circuits are fabricated in large numbers by a complex series of printing steps on silicon wafers. This process permits integrated circuits to be produced cheaply but … Wikipedia
Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… … Wikipedia
Lab-on-a-chip — This article is about the technology. For the journal, see Lab on a Chip (journal). Lab on a chip made of glass A lab on a chip (LOC) is a device that integrates one or several laboratory functions on a single chip of only millimeters to a few… … Wikipedia
plokštelės lustų tikrinimas — statusas T sritis radioelektronika atitikmenys: angl. on wafer chip testing vok. Chiptesten auf dem Wafer, n; On Wafer Chiptesten, n rus. проверка кристаллов ИС на пластине, f pranc. test des puces in situ, m … Radioelektronikos terminų žodynas
test des puces in situ — plokštelės lustų tikrinimas statusas T sritis radioelektronika atitikmenys: angl. on wafer chip testing vok. Chiptesten auf dem Wafer, n; On Wafer Chiptesten, n rus. проверка кристаллов ИС на пластине, f pranc. test des puces in situ, m … Radioelektronikos terminų žodynas
проверка кристаллов ИС на пластине — plokštelės lustų tikrinimas statusas T sritis radioelektronika atitikmenys: angl. on wafer chip testing vok. Chiptesten auf dem Wafer, n; On Wafer Chiptesten, n rus. проверка кристаллов ИС на пластине, f pranc. test des puces in situ, m … Radioelektronikos terminų žodynas
